Laboratory for Multiscale Imaging

The Laboratory for Multiscale Imaging (LMSI) is a vibrant research facility that promotes learning and research activities by offering training classes and seminars within an open and multiuser laboratory space. It is open to the entire Stevens community as well as outside researchers.

LMSI provides state-of-the-art instrumentation and expertise in morphological characterization to support and elevate research, and it helps leverage Stevens' capabilities to attract further support for new and significant self-sustaining programs. The LMSI is directed by Prof. Matthew Libera, and it is staffed by full-time research scientist, Dr. Tsengming (Alex) Chou.

LMSI Equipment Fees LMSI Media Gallery LMSI Related Publications

Instrumentation

FEI CM20 FE S/TEM with a Schottky field emitter and a TWIN pole pieces objective lens : 0.282 nm point resolution, 0.144 nm line resolution, and 0.180 nm information limit at 200 kV (TEM mode), and 1.0 nm BF/DF STEM resolution.

Aperture holder pos.1 pos.2 pos.3 pos.4
Condenser 1 2 mm 70 um 50 um 30 um
Condenser 2 150 um 100 um 50 um 30 um
Objective 100 um 40 um 20 um 10 um
Select-area 800 um 200 um 40 um 10 um

Energy Spread : <= 0.8 eV (Extr. Voltage < 3 kV) and <= 1 eV (Extr. Voltage > 3 kV)
With Gatan 792 Multi-scan CCD (1kx1k) camera
Gatan Enfina PEELS system
Gatan On-axis BF/DF STEM detector
Gatan Digi-Scan digital STEM data acquisition system
FEI Emispec digital STEM data acquisition system
Gatan cryo-shield for cryo S/TEM
off-axis TV rate camera
various room temperature and low temperature TEM holders.

Regarding to basic information of becoming a self-user, hourly rate, training and etc., please click here to download the LMSI TEM Users Guide. Please contact Dr. Tsengming (Alex) Chou at 201-216-8310 if you have any questions.
Nanotechnology Workstation : combine both FE-SEM and HR-FIB, sample can be manipulated in nano-scale.

High Resolution FESEM
a GEMINI field-emission electron column that provides resolution of 1.0 nm @ 15 kV and 1.9 nm @ 1 kV.

This FE-SEM can:
magnification: 12x to 1000 kx
probe current: 4pA to 20 nA
HV: 0.1 to 30 kV
with in-lens SE detector, Everhart-Thornley type SE chamber detector, in-lens EsB (energy selective backscattering) detector, and a STEM BF/DF detector for the thin specimen.
N2 gas charge compensation device is also available.

High Resolution FIB
Resolution down to 2.5 nm @ 30 kV via this Cobra ion column
source: liquid metal gallium ion source
magnification: 300x to 500kx
probe current: 1 pA to 50 nA
HV: 1.0 to 30 kV
with Pt GIS (gas injection system) to provide both electron and ion beam induced deposition.

Introduction to 3D Reconstruction
Image stack of serial sectioned images at nano-scale can be produced on this system. Using Avizo 3D reconstruction and visualization platform, studies of 3D nano-structure can be achieved.

High Resolution STEM Imaging
Using the retractable BF/DF STEM detector, sample can be imaged in STEM (scanning transmission electron microscopy) mode via electrons have up to 30 kV energy. It provides structure information on a thin specimen.

TEM Sample Preparation
Automatic TEM sample preparation can be done using in-situ lift out method via Kleindiek nano-manipulator (model: MM3A).

Advanced Analytical Platform
A 80 mm2 Oxford SDD (silicon drift detector) EDS system provides a high through-put and high resolution microanalysis capability.

Electron and Ion Beam Lithography
Via Nabity's NPGS system, lithography can be done via either electron or ion beam.

Cryo-capability
A Leica VCT cryo-transfer system is coming soon to provide a cryo-EM capability on this system.