RF Imaging Solutions in Silicon Technology

abstract depiction of computer engineering

Department of Electrical and Computer Engineering

Location: Burchard 714

Speaker: Richard Al Hadi, Université du Quebec, Ecole de Technologie Supérieur, Montreal, QC, Canada


Integrated circuits in silicon technologies have been increasingly used for detecting and generating mm-wave and sub-mm-wave signals. Despite physical limitation related to the devices speed and cutoff frequencies, circuit design techniques have been implemented to integrate terahertz systems well beyond those limitations. Imaging is one of the most targeted applications to demonstrate those systems. The large available bandwidth combined with on-chip multi-element integration is enabling more application. Many challenges are still to be addressed, starting from the sources total radiated power, the tuning range, and the their coherence. The detectors are also in need of improved sensitivity, and tuning range. This presentation will focus on the design challenges of generating sub-mm-wave signals, and detecting them in silicon technology well beyond silicon device limitations.


headshot of Richard Al Hadi wearing glasses, smiling

Dr. Richard Al Hadi received the engineering diploma from Caen's National Graduate School of Engineering in Electronics and Applied Physics and the Master degree from the University of Caen Basse-Normandie, France, in 2009. He received the Ph.D. degree from the University of Wuppertal, Germany, in 2014. Dr. Al Hadi has joined University of California, Los Angeles (UCLA) in 2015 as a postdoctoral research fellow. He was leading the research effort at Alcatera Inc between 2017-2022. Since 2022, he is an Associate Professor at Université du Québec, Ecole de Technologie Superieure, Montreal. Dr. Al Hadi is a senior IEEE society member and is the co-recipient of IEEE and MTT awards.