Instruments

Major Equipments
 

Supporting Equipment
 

  • Gatan cryo-plunger
  • Gatan Dry Pumping station
  • Olympus optical microscope
  • thermo evaporator
  • sputter coater
  • Leica Ultracut cryo/microtome

User Charge

See below table.

FEI CM20 field-emission S/TEM

FEI CM20 FE S/TEM with a Schottky field emitter and a TWIN pole pieces objective lens : 0.282 nm point resolution, 0.144 nm line resolution, and 0.180 nm information limit at 200 kV (TEM mode), and 1.0 nm BF/DF STEM resolution.

Aperture holderpos.1pos.2pos.3pos.4
Condenser 12 mm70 um50 um30 um
Condenser 2150 um100 um50 um30 um
Objective100 um40 um20 um10 um
Select-area800 um200 um40 um10 um

Energy Spread : <= 0.8 eV (Extr. Voltage < 3 kV) and <= 1 eV (Extr. Voltage > 3 kV)
With  Gatan 792 Multi-scan CCD (1kx1k) camera
Gatan Enfina PEELS system
Gatan On-axis BF/DF STEM detector
Gatan Digi-Scan digital STEM data acquisition system
FEI Emispec digital STEM data acquisition system
Gatan cryo-shield for cryo S/TEM
off-axis TV rate camera
various room temperature and low temperature TEM holders.

Regarding to basic information of becoming a self-user, hourly rate, training and etc., please click here to download the LMSI TEM Users Guide.  Please contact Dr. Tsengming (Alex) Chou at 201-216-8310 if you have any questions.


Zeiss Auriga Small Dual-Beam FIB-SEM
 

Nanotechnology Workstation : combine both FE-SEM and HR-FIB, sample can be manipulated in nano-scale.

 

High Resolution FESEM

a GEMINI field-emission electron column that provides resolution of 1.0 nm @ 15 kV and 1.9 nm @ 1 kV. 

 

This FE-SEM can:

magnification: 12x to 1000 kx

probe current: 4pA to 20 nA

HV: 0.1 to 30 kV

with in-lens SE detector, Everhart-Thornley type SE chamber detector, in-lens EsB (energy selective backscattering) detector, and a STEM BF/DF detector for the thin specimen.

N2 gas charge compensation device is also available.

 

High Resolution FIB

Resolution down to 2.5 nm @ 30 kV via this Cobra ion column

source: liquid metal gallium ion source

magnification: 300x to 500kx

probe current: 1 pA to 50 nA

HV: 1.0 to 30 kV

with Pt GIS (gas injection system) to provide both electron and ion beam induced deposition.

 

Introduction to 3D Reconstruction

Image stack of serial sectioned images at nano-scale can be produced on this system.  Using Avizo 3D reconstruction and visualization platform, studies of 3D nano-structure can be achived. 

 

High Resolution STEM Imaging

Using the retractable BF/DF STEM detector, sample can be imaged in STEM (scanning transmission electron microscopy) mode via electrons have up to 30 kV energy.  It provides structure information on a thin specimen.

 

TEM Sample Preparation

Automatic TEM sample preparation can be done using in-situ lift out method via Kleindiek nano-manipulator (model: MM3A).

 

Advanced Analytical Platform

A 80 mm2 Oxford SDD (silicon drift detector) EDS system provides a high through-put and high resolution microanalysis capability.

 

Electron and Ion Beam Lithography

Via Nabity's NPGS system, lithography can be done via either electron or ion beam.

 

Cryo-capability

A Leica VCT cryo-transfer system is coming soon to provide a cryo-EM capability on this system.


NanoInk DPN / Aglient NanoR AFM

For AFM mode only using Agilent SPM Cockpit program:  a simple instruction can be download here.  For an official overview, click here to download the document.  A guided page of using NanoR in contact mode, click here to download the document.  A guided page of using NanoR in non-/close-contact mode, click here to download the document.

For DPN users, click here to download the Quick user guide prepared by NanoInk.  For a complete user manual, click here to download.  InkCAD program can also image the sample surface similar to SPM Cockpit program, but with a limit capability.

Nikon E-1000 + C1 LSCM

Nikon E-1000 up-right florescent microscope with automatic stage control.  

A high sensitive monochromatic CCD camera for florescent imaging

Nikon C-1 LSCM with 3 lasers

Regarding to basic information of becoming a self-user, hourly rate, training and etc., please click here to download the LMSI Nikon/Confocal Users Guide.  Regarding to the basic laser safety information when using the Confocal system, please visit Nikon Microscopy University web-site and search for the laser safety information. Or, download the printable version of the Nikon document by clicking here. Please contact Dr. Tsengming (Alex) Chou at 201-216-8310 if you have any questions.

User Fee

Instrument

Outside selfuser

Additional fee for using staff assistance

TEM

$ 150/hr

$100/hr

SEM

$ 150/hr

$100/hr

AFM

$ 50/hr

$100/hr

Nikon*

$ 50/hr

$100/hr

TEM training: 2 hrs of lectures and 2 to 4 hrs of hands on practice.  $300 for internal Stevens users and $2,000 for external users

SEM training: 2 hrs of video training, 2 to 4 hrs of hands on practice.  $300 for internal Stevens users and $2,000 for external users

AFM and Nikon training will be arranged separately. Please consult with LMSI staff.

*Nikon E-1000 up-right light microscope with Epi-florescent, phase contrast, and LSCM (laser-scanning confocal microscopy).