- FEI CM20 field-emission S/TEM
- Zeiss Auriga Small Dual-Beam FIB-SEM
- NanoInk DPN/Agilent NanoR AFM
- Nikon E-1000 + C1 LSCM
- Gatan cryo-plunger
- Gatan Dry Pumping station
- Olympus optical microscope
- thermo evaporator
- sputter coater
- Leica Ultracut cryo/microtome
See below table.
FEI CM20 field-emission S/TEM
FEI CM20 FE S/TEM with a Schottky field emitter and a TWIN pole pieces objective lens : 0.282 nm point resolution, 0.144 nm line resolution, and 0.180 nm information limit at 200 kV (TEM mode), and 1.0 nm BF/DF STEM resolution.
|Condenser 1||2 mm||70 um||50 um||30 um|
|Condenser 2||150 um||100 um||50 um||30 um|
|Objective||100 um||40 um||20 um||10 um|
|Select-area||800 um||200 um||40 um||10 um|
Energy Spread : <= 0.8 eV (Extr. Voltage < 3 kV) and <= 1 eV (Extr. Voltage > 3 kV)
With Gatan 792 Multi-scan CCD (1kx1k) camera
Gatan Enfina PEELS system
Gatan On-axis BF/DF STEM detector
Gatan Digi-Scan digital STEM data acquisition system
FEI Emispec digital STEM data acquisition system
Gatan cryo-shield for cryo S/TEM
off-axis TV rate camera
various room temperature and low temperature TEM holders.
Regarding to basic information of becoming a self-user, hourly rate, training and etc., please click here to download the LMSI TEM Users Guide. Please contact Dr. Tsengming (Alex) Chou at 201-216-8310 if you have any questions.
Zeiss Auriga Small Dual-Beam FIB-SEM
Nanotechnology Workstation : combine both FE-SEM and HR-FIB, sample can be manipulated in nano-scale.
High Resolution FESEM
a GEMINI field-emission electron column that provides resolution of 1.0 nm @ 15 kV and 1.9 nm @ 1 kV.
This FE-SEM can:
magnification: 12x to 1000 kx
probe current: 4pA to 20 nA
HV: 0.1 to 30 kV
with in-lens SE detector, Everhart-Thornley type SE chamber detector, in-lens EsB (energy selective backscattering) detector, and a STEM BF/DF detector for the thin specimen.
N2 gas charge compensation device is also available.
High Resolution FIB
Resolution down to 2.5 nm @ 30 kV via this Cobra ion column
source: liquid metal gallium ion source
magnification: 300x to 500kx
probe current: 1 pA to 50 nA
HV: 1.0 to 30 kV
with Pt GIS (gas injection system) to provide both electron and ion beam induced deposition.
Introduction to 3D Reconstruction
Image stack of serial sectioned images at nano-scale can be produced on this system. Using Avizo 3D reconstruction and visualization platform, studies of 3D nano-structure can be achived.
High Resolution STEM Imaging
Using the retractable BF/DF STEM detector, sample can be imaged in STEM (scanning transmission electron microscopy) mode via electrons have up to 30 kV energy. It provides structure information on a thin specimen.
TEM Sample Preparation
Automatic TEM sample preparation can be done using in-situ lift out method via Kleindiek nano-manipulator (model: MM3A).
Advanced Analytical Platform
A 80 mm2 Oxford SDD (silicon drift detector) EDS system provides a high through-put and high resolution microanalysis capability.
Electron and Ion Beam Lithography
Via Nabity's NPGS system, lithography can be done via either electron or ion beam.
A Leica VCT cryo-transfer system is coming soon to provide a cryo-EM capability on this system.
NanoInk DPN / Aglient NanoR AFM
For AFM mode only using Agilent SPM Cockpit program: a simple instruction can be download here. For an official overview, click here to download the document. A guided page of using NanoR in contact mode, click here to download the document. A guided page of using NanoR in non-/close-contact mode, click here to download the document.
For DPN users, click here to download the Quick user guide prepared by NanoInk. For a complete user manual, click here to download. InkCAD program can also image the sample surface similar to SPM Cockpit program, but with a limit capability.
Nikon E-1000 + C1 LSCM
Nikon E-1000 up-right florescent microscope with automatic stage control.
A high sensitive monochromatic CCD camera for florescent imaging
Nikon C-1 LSCM with 3 lasers
Regarding to basic information of becoming a self-user, hourly rate, training and etc., please click here to download the LMSI Nikon/Confocal Users Guide. Regarding to the basic laser safety information when using the Confocal system, please visit Nikon Microscopy University web-site and search for the laser safety information. Or, download the printable version of the Nikon document by clicking here. Please contact Dr. Tsengming (Alex) Chou at 201-216-8310 if you have any questions.
Additional fee for using staff assistance
TEM training: 2 hrs of lectures and 2 to 4 hrs of hands on practice. $300 for internal Stevens users and $2,000 for external users
SEM training: 2 hrs of video training, 2 to 4 hrs of hands on practice. $300 for internal Stevens users and $2,000 for external users
AFM and Nikon training will be arranged separately. Please consult with LMSI staff.
*Nikon E-1000 up-right light microscope with Epi-florescent, phase contrast, and LSCM (laser-scanning confocal microscopy).