ECE seminar series: Improving Reliability of Modern Microprocessors

Wednesday, April 30, 2014 ( 3:00 pm to 4:00 pm )

Location: Babbio Center, Room 319

Contact: 
Prof. Yingying (yingying.chen@stevens.edu)

Improving Reliability of Modern Micro-processors

 

BY Dr. Naghmeh Karimi

Assistant Professor, ECE Department

Polytechnic School of Engineering at New York University

 

ABSTRACT

Reliability, trustworthiness, and performance of microprocessors have become major concerns regarding the deployment of microprocessors in a wide range of application domains. On the other hand, modern microprocessors exhibit a high degree of application-level error masking, which suppresses a significant percentage of errors and prevents them from interfering with correct program execution. Therefore, applying generic robustness solutions for microprocessors typically incurs prohibitive costs. This talk explores how the workload-cognizant analysis of the impact of various malfunctions in modern processors may effectively guide in identifying the most vulnerable functionality of the microprocessors and developing robustness solutions for them.

 

BIOGRAPHY

Naghmeh Karimi is a visiting Assistant Professor of the Polytechnic School of Engineering at New York University. She received a Ph.D. degree in Electrical Engineering from the University of Tehran in 2010. She was a visiting researcher at Yale University for two years during her Ph.D. program and a Post-doctoral researcher at Duke University after the completion of her Ph.D. program. Her research interests include design-for-testability and security, concurrent testing, fault tolerance, hardware security, and computer architecture.