The Cryo FIB-SEM Workshop at Stevens Institute of TechnologyWorkshop Program
Tuesday, 27 September, 2011
9:30 - 9:55 On-site Registration (W Hotel Hoboken)
09:55 - 10:00 Welcome and Overview (Matt Libera)
10:00 - 10:40 Recent Advances in Scanning Electron Microscopy and Low-Loss Backscattered Detection
- Heiner Jaksch, Carl Zeiss
10:40 - 11:20 Fundamentals of Focused Ion Beam Techniques
- Keana Scott, NIST
11:20 - 12:00 Integrating Cryo EM and FIB-SEM to Study Hydrated Soft Materials
- Matthew Libera, Stevens Institute of Technology
12:00 - 1:00 Lunch at Hoboken W
1:00 - 2:15 Open house at the Stevens LMSI
Laboratory for MultiScale Imaging
1:00 - 1:30 Open Lab Tour (Matt Libera and Alex Chou, Stevens)
1:30 - 1:45 Demo Period 1
1:45 - 2:00 Demo Period 2
2:00 - 2:15 Demo Period 3
Demo A - Cryo Specimen Preparation (Kim Rensing, Leica)
Demo B - Cryo FIB-SEM (Alex Chou, Stevens)
Demo C - Cryo TEM (Emre Firlar, Stevens)
2:40 - 4:30 Focus Group Meeting at W
Hotel
2:40 - 2:45 Welcome and Overview
2:45 - 3:05 Advances in cryo instrumentation (Kim Rensing, Leica)
3:05 - 3:25 Cryo reduction of ion beam damage (Alex Chou,
Stevens)
3:25 - 3:45 Cryo-FIB preparation of vitreously frozen biological
material for cryo-TEM (Mike Marko, Wadsworth Center)
3:45 - 4:30 Open Discussion
4:30 Adjournment
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