LMSI

Laboratory for Multiscale Imaging

A Shared Resource for Multidisciplinary Research and Training

Charles V. Schaefer Jr.School of Engineering and Science

Stevens Institute of Technology

Instruments

Major Equipments

Supporting Equipment

User Charge

See below table.

FEI CM20 field-emission S/TEM

FEI CM20 FE S/TEM

with a Schottky field emitter and a TWIN pole pieces objective lens : 0.282 nm point resolution, 0.144 nm line resolution, and 0.180 nm information limit at 200 kV (TEM mode), and 1.0 nm BF/DF STEM resolution.

Aperture holder pos.1 pos.2 pos.3 pos.4
Condenser 1 2 mm 70 um 50 um 30 um
Condenser 2 150 um 100 um 50 um 30 um
Objective 100 um 40 um 20 um 10 um
Select-area 800 um 200 um 40 um 10 um

Energy Spread : <= 0.8 eV (Extr. Voltage < 3 kV) and <= 1 eV (Extr. Voltage > 3 kV)

With  Gatan 792 Multi-scan CCD (1kx1k) camera
        Gatan Enfina PEELS system
        Gatan On-axis BF/DF STEM detector
        Gatan Digi-Scan digital STEM data acquisition system
        FEI Emispec digital STEM data acquisition system
        Gatan cryo-shield for cryo S/TEM
        off-axis TV rate camera
        various room temperature and low temperature TEM holders             

Regarding to basic information of becoming a self-user, hourly rate, training and etc., please click here to download the LMSI TEM Users Guide.  Please contact Dr. Tsengming (Alex) Chou at 201-216-8310 if you have any questions.

Zeiss 982 field-emission SEM

Zeiss 982 FE-SEM with Oxford ISIS EDS system

SEM resolution : 1 nm @ 30 kV ;4 nm @  1 kV Detectors: Convectional E-T detector, in-lens detector, 4-diodes solid-state BSE detector   Oxford ISIS EDS system with 135 eV resolution and it is capable of collecting spectrum from multiples points, lines across the interface, and elemental mapping.  

It also equips a home-made e-beam lithography system with 100 nm or so resolution.

Regarding to basic information of becoming a self-user, hourly rate, training and etc., please click here to download the LMSI SEM Users Guide.  Please contact Dr. Tsengming (Alex) Chou at 201-216-8310 or Dr. Berton Greenberg at 201-216-5258 if you have any questions.

NanoInk DPN / Aglient NanoR AFM

For AFM mode only using Agilent SPM Cockpit program:  a simple instruction can be download here.  For an official overview, click here to download the document.  A guided page of using NanoR in contact mode, click here to download the document.  A guided page of using NanoR in non-/close-contact mode, click here to download the document.

For DPN users, click here to download the Quick user guide prepared by NanoInk.  For a complete user manual, click here to download.  InkCAD program can also image the sample surface similar to SPM Cockpit program, but with a limit capability.

Nikon E-1000 + C1 LSCM

Nikon E-1000 up-right florescent microscope with automatic stage control.  

A high sensitive monochromatic CCD camera for florescent imaging

Nikon C-1 LSCM with 3 lasers

Regarding to basic information of becoming a self-user, hourly rate, training and etc., please click here to download the LMSI Nikon/Confocal Users Guide.  Regarding to the basic laser safety information when using the Confocal system, please visit Nikon Microscopy University web-site and search for the laser safety information.  Or, download the printable version of the Nikon document by clicking here.  Please contact Dr. Tsengming (Alex) Chou at 201-216-8310 if you have any questions.

User Fee

Instrument Stevens users with assistance outside users with assistance
TEM $50/hr $ 50+35/hr $150/hr $ 150+100/hr
SEM $50/hr $ 50+35/hr $150/hr $ 150+100/hr
AFM $10/hr $ 10+35/hr $50/hr n/a
Nikon* $10/hr $ 10+35/hr $50/hr n/a

TEM training: 4 hrs of lectures and 6 to 8 hrs of hands on practice.  $200 for internal Stevens users and $1000 for external users

SEM training: 2 hrs of video training, 2 to 4 hrs of hands on practice.  $200 for internal Stevens users and $1000 for external users

AFM and Nikon training will be arranged separately. Please consult with LMSI staff.

*Nikon E-1000 up-right light microscope with Epi-florescent, phase contrast, and LSCM (laser-scanning confocal microscopy).